CHARACTERISTICS OF A SPUTTERED Y-BA-CU-O THIN-FILM DC SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE PREPARED BY RF-SPUTTERING

被引：3

作者：

GOTO, T

YING, XB

PARK, CH

TAKEDA, Y

USAMI, K

KOBAYASHI, T

机构：

[1] Department of Communications and Systems, University of Electro-Communications, Chofu, Tokyo 182

来源：

JOURNAL OF APPLIED PHYSICS | 1991年 / 70卷 / 03期

关键词：

D O I：

10.1063/1.349505

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A dc superconducting quantum interference device (SQUID) is fabricated on an amorphous Y-Ba-Cu-O film by a photolithographic technique and successive post-annealing treatment. The SQUID shows periodic and symmetric behavior in the voltage versus magnetic-flux curves (V-PHI curves). No multiple periodicities are observed. The transfer function partial-V/partial-PHI for output voltage is about 90 20-mu-V/PHI-0 at 4.2 and 56 K, respectively. It is expected that the SQUID contains only two symmetric active Josephson junctions.

引用

页码：1856 / 1857

页数：2

共 11 条

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