APPLICATION OF X-RAY-DIFFRACTION LINE SMOOTHING TO SEPARATION OF K-ALPHA-1 AND K-ALPHA-2 DOUBLET

被引：14

作者：

MIGNOT, J ^{[1
]}

RONDOT, D ^{[1
]}

机构：

[1] FAC SCI BESANCON,CNRS,MECANIQUE APPL LAB,F-25030 BESANCON,FRANCE

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1976年 / 9卷 / DEC1期

关键词：

D O I：

10.1107/S0021889876011928

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

收藏

页码：460 / 465

页数：6

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共 12 条

[1] Shapes and wavelengths of K series lines of elements Ti 22 to Ge 32
Bearden, JA
Shaw, CH
[J]. PHYSICAL REVIEW, 1935, 48 (01): : 18 - 30
[2] BERGEVIN FD, 1972, J APPL CRYSTALLOGR, V5, P416
[3] SEPARATION OF ALPHA1-ALPHA2 DOUBLET IN X-RAY DIFFRACTION PROFILES
GANGULEE, A
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1970, 3 : 272 - &
[4] SEPARATION OF PARTICLE-SIZE AND MICROSTRAIN COMPONENTS IN FOURIER COEFFICIENTS OF A SINGLE DIFFRACTION PROFILE
GANGULEE, A
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1974, 7 (AUG1) : 434 - 439
[5] DIRECT EVALUATION OF KALPHA-1 FOURIER COEFFICENTS IN X-RAY PROFILE ANALYSIS
KIDRON, A
DEANGELI.RJ
[J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1971, A 27 (NOV1) : 596 - &
[6] INTERPRETATION OF DIFFRACTOMETER LINE PROFILES
LADELL, J
PARRISH, W
TAYLOR, J
[J]. ACTA CRYSTALLOGRAPHICA, 1959, 12 (08): : 561 - 567
[7] CU K-ALPHA-2 ELIMINATION ALGORITHM
LADELL, J
ZAGOFSKY, A
PEARLMAN, S
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1975, 8 (OCT1) : 499 - 506
[8] VARIANCE AND OTHER MEASURES OF LINE BROADENING IN POWDER DIFFRACTOMETRY .2. DETERMINATION OF PARTICLE SIZE
LANGFORD, JI
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1968, 1 : 131 - &
[9] MIGNOT J, 1975, ACTA METALL MATER, V23, P1321, DOI 10.1016/0001-6160(75)90140-6
[10] SEPARATION OF OVERLAPPING PEAKS IN X-RAY POWDER PATTERNS WITH USE OF AN EXPERIMENTAL PROFILE
MORTIER, WJ
COSTENOB.ML
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1973, 6 (DEC1) : 488 - 490