CRACK NETWORKS IN THIN-FILMS

被引：11

作者：

MULHERAN, PA ^{[1
]}

机构：

[1] AEA IND TECHNOL,HARWELL LAB BY244,DEPT THEORET STUDIES,DIDCOT OX11 0RA,OXON,ENGLAND

来源：

PHILOSOPHICAL MAGAZINE LETTERS | 1993年 / 68卷 / 02期

关键词：

D O I：

10.1080/09500839308240494

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We present a simple simulation for the development of crack networks in thin films. These networks are found to be statistically self-similar as the number of cracks increases. The distributions of shapes and sizes found in the simulations compare favourably with those observed in experimental films. The scaling behaviour helps to explain the similarity between crack networks found in a variety of real systems.

引用

页码：63 / 68

页数：6