ELLIPTICAL SPECTROGRAPH GATED MICROCHANNEL-PLATE DETECTOR FOR TIME-RESOLVED SPECTRAL MEASUREMENTS IN THE X-RAY REGION

被引：5

作者：

HAMMEL, BA

RUGGLES, LE

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1988年 / 59卷 / 08期

关键词：

D O I：

10.1063/1.1140073

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：1828 / 1830

页数：3

共 9 条

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