STOICHIOMETRIC EFFECTS IN EPITAXIAL BA2-XY1-YCU3-ZO7-DELTA THIN-FILMS ON LAALO3(100)

被引:30
作者
CARLSON, DJ
SIEGAL, MP
PHILLIPS, JM
TIEFEL, TH
MARSHALL, JH
机构
[1] AT&T BELL LABS,600 MT AVE,MURRAY HILL,NJ 07974
[2] MIT,DEPT MAT SCI & ENGN,CAMBRIDGE,MA 02139
关键词
D O I
10.1557/JMR.1990.2797
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Stoichiometric deviations of up to ±5% in Ba2YCu3O7-δthin films grown by coevaporation on LaAlO3(100) substrates are found to cause (1) a decrease of the critical current density (Jc) of up to an order of magnitude, (2) a depression of the critical temperature (Tc) and a broadening of the superconducting transition width (AT), (3) a deterioration of the surface morphology, and (4) a decrease in the crystallinity of the films. The data indicate that composition deviations of greater than ±1% result in degradation of film quality. These findings have significant implications for the degree of composition control required during deposition to produce films with optimized properties. © 1990, Materials Research Society. All rights reserved.
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页码:2797 / 2801
页数:5
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