COVERAGE OF SI SUBSTRATES BY SELF-ASSEMBLING MONOLAYERS AND MULTILAYERS AS MEASURED BY IR, WETTABILITY AND X-RAY-DIFFRACTION

被引:192
作者
POMERANTZ, M [1 ]
SEGMULLER, A [1 ]
NETZER, L [1 ]
SAGIV, J [1 ]
机构
[1] WEIZMANN INST SCI,DEPT ISOTOPE,IL-76100 REHOVOT,ISRAEL
关键词
D O I
10.1016/0040-6090(85)90466-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
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页码:153 / 162
页数:10
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