ROLE OF DISORDERED REGIONS IN FAST-NEUTRON DAMAGE OF HPGE DETECTORS

被引：9

作者：

DARKEN, LS

机构：

[1] Oxford Instruments, Inc., P.O. Box 2560, 1620 Oak Ridge Turnpike, Oak Ridge

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1993年 / 74卷 / 04期

关键词：

D O I：

10.1016/0168-583X(93)95951-Z

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Published data on resolution degradation of high-purity germanium (HPGe) detectors after irradiation with fast neutrons are reviewed, and the possible role of point defects is quantified. Resolution degradation is between one and two orders of magnitude too severe to be attributed to the point defects present. Disordered regions must dominate resolution degradation until the detector has been sufficiently annealed that the pre-irradiation resolution is almost recovered. In capacitance spectroscopy the corresponding emission from these disordered regions has presented problems either in identification or interpretation.

引用

页码：523 / 526

页数：4

共 14 条

[11]

PARSONS JR, 1962, APPL PHYS LETT, V1, P3

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