INTERLAYER MASS-TRANSPORT IN HOMOEPITAXIAL AND HETEROEPITAXIAL METAL GROWTH

被引:156
作者
BROMANN, K
BRUNE, H
RODER, H
KERN, K
机构
[1] Institut de Physique Expérimentale, Ecole Polytechnique Fédérale-Lausanne
关键词
D O I
10.1103/PhysRevLett.75.677
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We describe a general method for the quantitative determination of the interlayer mass transport in epitaxial growth. Through measurement of the nucleation rate on top of islands as a function of island size and temperature, the additional barrier for an adatom to descend the step edge Delta E(s) can be determined with high accuracy. This approach is applied to the growth of Ag on the (111) surfaces of Ag and Pt. In the homoepitaxial system, the barrier is found to be Delta E(s) = 120 +/- 15 meV, whereas in the heteroepitaxial case it is substantially lowered, Delta E(s) = 30 +/- 5 meV.
引用
收藏
页码:677 / 680
页数:4
相关论文
共 28 条
  • [1] SURFACE ATOM DISPLACEMENT PROCESSES
    BASSETT, DW
    [J]. SURFACE SCIENCE, 1975, 53 (DEC) : 74 - 86
  • [2] BAUER E, 1958, Z KRISTALLOGR, V110, P423
  • [3] AGGREGATION OF FRACTAL AND DENDRITIC AG CLUSTERS ON A PT(111) SURFACE
    BRUNE, H
    RODER, H
    ROMAINCZYK, C
    BORAGNO, C
    KERN, K
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1995, 60 (02): : 167 - 171
  • [4] MICROSCOPIC VIEW OF NUCLEATION ON SURFACES
    BRUNE, H
    RODER, H
    BORAGNO, C
    KERN, K
    [J]. PHYSICAL REVIEW LETTERS, 1994, 73 (14) : 1955 - 1958
  • [5] STRAIN RELIEF AT HEXAGONAL-CLOSE-PACKED INTERFACES
    BRUNE, H
    RODER, H
    BORAGNO, C
    KERN, K
    [J]. PHYSICAL REVIEW B, 1994, 49 (04): : 2997 - 3000
  • [6] BRUNE HA, IN PRESS
  • [7] ATOMIC VIEW OF SURFACE SELF-DIFFUSION - TUNGSTEN ON TUNGSTEN
    EHRLICH, G
    HUDDA, FG
    [J]. JOURNAL OF CHEMICAL PHYSICS, 1966, 44 (03) : 1039 - &
  • [8] DIRECT OBSERVATIONS OF THE SURFACE-DIFFUSION OF ATOMS AND CLUSTERS
    EHRLICH, G
    [J]. SURFACE SCIENCE, 1991, 246 (1-3) : 1 - 12
  • [9] ORIGIN OF OXYGEN-INDUCED LAYER-BY-LAYER GROWTH IN HOMOEPITAXY ON PT(111)
    ESCH, S
    HOHAGE, M
    MICHELY, T
    COMSA, G
    [J]. PHYSICAL REVIEW LETTERS, 1994, 72 (04) : 518 - 521
  • [10] GROWTH AND PROPERTIES OF THIN AG FILMS ON PT(111) SURFACES
    HARTEL, T
    STRUBER, U
    KUPPERS, J
    [J]. THIN SOLID FILMS, 1993, 229 (02) : 163 - 170