MEASUREMENT OF STRAIN AND LATTICE-PARAMETER IN EPITAXIC LAYERS

[1] VERY HIGH PRECISION X-RAY DIFFRACTION [J]. NATURE, 1966, 210 (5037) : 720 - &

[2] PRECISION LATTICE CONSTANT DETERMINATION [J]. ACTA CRYSTALLOGRAPHICA, 1960, 13 (10): : 814 - 818

[3] HIGH PRECISION LATTICE PARAMETER MEASUREMENTS BY MULTIPLE BRAGG REFLEXION DIFFRACTOMETRY [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1969, 309 (1497): : 281 - &

[4] Zachariasen W. H., 1945, THEORY XRAY DIFFRACT

[1] VERY HIGH PRECISION X-RAY DIFFRACTION [J]. NATURE, 1966, 210 (5037) : 720 - &

[2] PRECISION LATTICE CONSTANT DETERMINATION [J]. ACTA CRYSTALLOGRAPHICA, 1960, 13 (10): : 814 - 818

[3] HIGH PRECISION LATTICE PARAMETER MEASUREMENTS BY MULTIPLE BRAGG REFLEXION DIFFRACTOMETRY [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1969, 309 (1497): : 281 - &

[4] Zachariasen W. H., 1945, THEORY XRAY DIFFRACT