DENSITY OF THIN EVAPORATED ALUMINUM FILMS

[1] ALLEN JA, 1959, STRUCTURE PROPERTIES, P46

[2] [Anonymous], [No title captured]

[3] BEHRNDT KH, 1960, VACUUM S T, P87

[4] APPARENT DENSITY OF THIN EVAPORATED FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1954, 25 (03) : 338 - 340

[5] SIMPLE HIGH SENSITIVITY MICROBALANCE FOR USE IN ULTRA-HIGH VACUUM [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1963, 34 (06) : 677 - &

[6] ELECTRON TUNNELING THROUGH THIN ALUMINUM OXIDE FILMS [J]. PHYSICAL REVIEW, 1964, 134 (4A): : 1094 - +

[7] ON THE PREPARATION OF HARD OXIDE FILMS WITH PRECISELY CONTROLLED THICKNESS ON EVAPORATED ALUMINUM MIRRORS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1949, 39 (07) : 532 - 540

[8] HOLLAND L, 1958, VACUUM DEPOSITION TH, P224

[9] LINS SJ, 1960, VACUUM S T, P333

[10] MCKOEWN D, 1961, REV SCI INSTRUM, V32, P133

[1] ALLEN JA, 1959, STRUCTURE PROPERTIES, P46

[2] [Anonymous], [No title captured]

[3] BEHRNDT KH, 1960, VACUUM S T, P87

[4] APPARENT DENSITY OF THIN EVAPORATED FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1954, 25 (03) : 338 - 340

[5] SIMPLE HIGH SENSITIVITY MICROBALANCE FOR USE IN ULTRA-HIGH VACUUM [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1963, 34 (06) : 677 - &

[6] ELECTRON TUNNELING THROUGH THIN ALUMINUM OXIDE FILMS [J]. PHYSICAL REVIEW, 1964, 134 (4A): : 1094 - +

[7] ON THE PREPARATION OF HARD OXIDE FILMS WITH PRECISELY CONTROLLED THICKNESS ON EVAPORATED ALUMINUM MIRRORS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1949, 39 (07) : 532 - 540

[8] HOLLAND L, 1958, VACUUM DEPOSITION TH, P224

[9] LINS SJ, 1960, VACUUM S T, P333

[10] MCKOEWN D, 1961, REV SCI INSTRUM, V32, P133