A DUAL PARAMETER (S VERSUS-TAV) POSITRON-ANNIHILATION SPECTROMETER UTILIZING THE BETA+-GAMMA-GAMMA-COINCIDENCE APPLIED TO THE STUDY OF DEFECTS IN AL

被引:3
作者
KOSTAMOVAARA, J
KARRAS, M
MYLLYLA, R
机构
关键词
D O I
10.1016/0168-583X(84)90573-1
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:80 / 87
页数:8
相关论文
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