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EQUIVALENT-CIRCUIT MODEL FOR ACTIVE-LAYER PHOTOMIXING - PARASITIC-FREE MODULATION OF SEMICONDUCTOR-LASERS
被引:5
作者
:
VAHALA, KJ
论文数:
0
引用数:
0
h-index:
0
VAHALA, KJ
NEWKIRK, MA
论文数:
0
引用数:
0
h-index:
0
NEWKIRK, MA
机构
:
来源
:
APPLIED PHYSICS LETTERS
|
1988年
/ 53卷
/ 13期
关键词
:
D O I
:
10.1063/1.100038
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:1141 / 1143
页数:3
相关论文
共 4 条
[1]
NOISE EQUIVALENT-CIRCUIT OF A SEMICONDUCTOR-LASER DIODE
[J].
HARDER, C
论文数:
0
引用数:
0
h-index:
0
机构:
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
HARDER, C
;
KATZ, J
论文数:
0
引用数:
0
h-index:
0
机构:
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
KATZ, J
;
MARGALIT, S
论文数:
0
引用数:
0
h-index:
0
机构:
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
MARGALIT, S
;
SHACHAM, J
论文数:
0
引用数:
0
h-index:
0
机构:
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
SHACHAM, J
;
YARIV, A
论文数:
0
引用数:
0
h-index:
0
机构:
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
YARIV, A
.
IEEE JOURNAL OF QUANTUM ELECTRONICS,
1982,
18
(03)
:333
-337
[2]
PARASITIC-FREE MEASUREMENT OF THE FUNDAMENTAL-FREQUENCY RESPONSE OF A SEMICONDUCTOR-LASER BY ACTIVE-LAYER PHOTOMIXING
[J].
NEWKIRK, MA
论文数:
0
引用数:
0
h-index:
0
NEWKIRK, MA
;
VAHALA, KJ
论文数:
0
引用数:
0
h-index:
0
VAHALA, KJ
.
APPLIED PHYSICS LETTERS,
1988,
52
(10)
:770
-772
[3]
FREQUENCY-RESPONSE OF 1.3-MU-M INGAASP HIGH-SPEED SEMICONDUCTOR-LASERS
[J].
OLSHANSKY, R
论文数:
0
引用数:
0
h-index:
0
OLSHANSKY, R
;
HILL, P
论文数:
0
引用数:
0
h-index:
0
HILL, P
;
LANZISERA, V
论文数:
0
引用数:
0
h-index:
0
LANZISERA, V
;
POWAZINIK, W
论文数:
0
引用数:
0
h-index:
0
POWAZINIK, W
.
IEEE JOURNAL OF QUANTUM ELECTRONICS,
1987,
23
(09)
:1410
-1418
[4]
VAHALA KJ, 1988 C LAS EL
←
1
→
共 4 条
[1]
NOISE EQUIVALENT-CIRCUIT OF A SEMICONDUCTOR-LASER DIODE
[J].
HARDER, C
论文数:
0
引用数:
0
h-index:
0
机构:
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
HARDER, C
;
KATZ, J
论文数:
0
引用数:
0
h-index:
0
机构:
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
KATZ, J
;
MARGALIT, S
论文数:
0
引用数:
0
h-index:
0
机构:
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
MARGALIT, S
;
SHACHAM, J
论文数:
0
引用数:
0
h-index:
0
机构:
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
SHACHAM, J
;
YARIV, A
论文数:
0
引用数:
0
h-index:
0
机构:
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
TECHNION ISRAEL INST TECHNOL,HAIFA,ISRAEL
YARIV, A
.
IEEE JOURNAL OF QUANTUM ELECTRONICS,
1982,
18
(03)
:333
-337
[2]
PARASITIC-FREE MEASUREMENT OF THE FUNDAMENTAL-FREQUENCY RESPONSE OF A SEMICONDUCTOR-LASER BY ACTIVE-LAYER PHOTOMIXING
[J].
NEWKIRK, MA
论文数:
0
引用数:
0
h-index:
0
NEWKIRK, MA
;
VAHALA, KJ
论文数:
0
引用数:
0
h-index:
0
VAHALA, KJ
.
APPLIED PHYSICS LETTERS,
1988,
52
(10)
:770
-772
[3]
FREQUENCY-RESPONSE OF 1.3-MU-M INGAASP HIGH-SPEED SEMICONDUCTOR-LASERS
[J].
OLSHANSKY, R
论文数:
0
引用数:
0
h-index:
0
OLSHANSKY, R
;
HILL, P
论文数:
0
引用数:
0
h-index:
0
HILL, P
;
LANZISERA, V
论文数:
0
引用数:
0
h-index:
0
LANZISERA, V
;
POWAZINIK, W
论文数:
0
引用数:
0
h-index:
0
POWAZINIK, W
.
IEEE JOURNAL OF QUANTUM ELECTRONICS,
1987,
23
(09)
:1410
-1418
[4]
VAHALA KJ, 1988 C LAS EL
←
1
→