HIGH MASS RESOLUTION TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY - APPLICATION TO PEAK ASSIGNMENTS

被引：62

作者：

NIEHUIS, E ^{[1
]}

VANVELZEN, PNT ^{[1
]}

LUB, J ^{[1
]}

HELLER, T ^{[1
]}

BENNINGHOVEN, A ^{[1
]}

机构：

[1] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS

来源：

SURFACE AND INTERFACE ANALYSIS | 1989年 / 14卷 / 03期

关键词：

D O I：

10.1002/sia.740140307

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：135 / 142

页数：8

共 24 条

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