SIMULATION OF ATOMIC-FORCE MICROSCOPE TIP-SAMPLE SAMPLE-TIP RECONSTRUCTION

被引：86

作者：

MARKIEWICZ, P ^{[1
]}

GOH, MC ^{[1
]}

机构：

[1] UNIV TORONTO,DEPT CHEM,TORONTO,ON M5S 1A1,CANADA

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1995年 / 13卷 / 03期

关键词：

D O I：

10.1116/1.587913

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The image obtained with the atomic force microscope is a convolution of the tip and sample. A numerical algorithm which has been previously reported enables the removal of the tip geometry, hence exposing a more accurate picture of the sample. The efficacy of such a scheme is explored with the use of simulations of the tip-sample interaction using simple geometric considerations. Two examples that illustrate the limitations of image analysis by such procedures are presented.

引用

页码：1115 / 1118

页数：4