XPS ANALYSIS OF THE OXIDATION REACTION OF RUTHENIUM CHALCOGENIDE PHOTOELECTRODES

被引：25

作者：

JAEGERMANN, W

KUHNE, HM

机构：

[1] Hahn-Meitner-Inst fuer Kernforschung, Berlin, Berlin, West Ger, Hahn-Meitner-Inst fuer Kernforschung Berlin, Berlin, West Ger

来源：

APPLIED SURFACE SCIENCE | 1986年 / 26卷 / 01期

关键词：

We like to thank Prof. H. Tributsch and Dr. D. Schmeisserfo r helpful discussionsT. his work was supportedb y the BMFT and the EC;

D O I：

10.1016/0169-4332(86)90048-6

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：1 / 11

页数：11

共 25 条

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[4]

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[10] X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES OF RUTHENIUM-OXYGEN SURFACES [J].

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