CONDITIONS FOR DIRECT STRUCTURE IMAGING IN SILICON-CARBIDE POLYTYPES

被引：25

作者：

SMITH, DJ

OKEEFE, MA

机构：

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1983年 / 39卷 / JAN期

关键词：

D O I：

10.1107/S0108767383000239

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：139 / 148

页数：10

共 38 条

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[3]

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SMITH, KCA ;

TIMBS, AE ;

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ROSS, PM .

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[6] THE SCATTERING OF ELECTRONS BY ATOMS AND CRYSTALS .1. A NEW THEORETICAL APPROACH [J].

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MOODIE, AF .

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[7]

ERIKSON HP, 1971, PHILOS T R SOC LON B, V261, P105

[8] COMPUTED ELECTRON-MICROSCOPE IMAGES OF ATOMIC DEFECTS IN ECC METALS [J].

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[9]

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[10]

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