THIN TARGET THICKNESS MEASUREMENT BY PHOTON INDUCED X-RAY-FLUORESCENCE

被引:7
作者
PARADELLIS, T [1 ]
机构
[1] NUCL RES CTR DEMOCRITOS,TANDEM ACCELERATOR LAB,ATHENS,GREECE
来源
NUCLEAR INSTRUMENTS & METHODS | 1977年 / 140卷 / 01期
关键词
D O I
10.1016/0029-554X(77)90089-1
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:205 / 209
页数:5
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