X-RAY REFRACTIVE-INDEX MEASUREMENT IN SILICON AND LITHIUM-FLUORIDE

被引：35

作者：

DEUTSCH, M ^{[1
]}

HART, M ^{[1
]}

机构：

[1] UNIV LONDON KINGS COLL,WHEATSTONE LAB,LONDON WC2R 2LS,ENGLAND

来源：

PHYSICAL REVIEW B | 1984年 / 30卷 / 02期

关键词：

D O I：

10.1103/PhysRevB.30.640

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：640 / 642

页数：3

共 22 条

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