Fabrication and dynamic testing of electrostatic actuators with p(+) silicon diaphragms

被引:7
作者
Yang, EH [1 ]
Yang, SS [1 ]
Han, SW [1 ]
Kim, SY [1 ]
机构
[1] AJOU UNIV,DEPT CONTROL & INSTRUMENTAT ENGN,MICROSYST LAB,SUWON 442749,SOUTH KOREA
关键词
corrugated diaphragms; p(+) diaphragms; residual stress; electrostatic actuators; dynamic testing;
D O I
10.1016/0924-4247(96)80100-2
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents the fabrication and testing of electrostatic actuators with p(+) diaphragms. The actuators consist of two counter electrodes which are fabricated on a silicon wafer and Pyrex glass, respectively. The p(+) diaphragm is used as a moving electrode, whereas the aluminium layer deposited on #7740 Pyrex glass is used as a fixed electrode. According to the calculation of static deflection of diaphragms with residual tensile stress, corrugated diaphragms deflect more than a flat one in most deflection regions. The dynamic characteristics of an actuator with a corrugated diaphragm and one with a flat diaphragm are tested and compared with the calculation results.
引用
收藏
页码:151 / 156
页数:6
相关论文
共 30 条
[1]  
BRANEBJERG J, 1992, FEB IEEE MICR SYST W, P6
[2]  
BUSTGENS B, 1994, IEEE MICROELECTROMEC, P18
[3]  
DING X, 1990, SENSOR ACTUAT A-PHYS, V21, P866
[4]  
DING X, 1991, 6TH INT C SOL STAT S, P93
[5]  
FOLTA JA, 1992, JUN IEEE SOL STAT SE, P186
[6]  
FUHR G, 1992, FEB IEEE MICR SYST W, P26
[7]  
GERLACH T, 1995, IEEE MICROELECTROMEC, P221
[8]  
HAMBERG MW, 1995, JAN IEEE MICR SYST W, P106
[9]  
LAMMERINK TSJ, 1993, FEB IEEE MICR SYST W, P254
[10]  
MASEEH F, 1990, SENSOR ACTUAT A-PHYS, V21, P861