RADIATION-DAMAGE IN ELECTRON-MICROSCOPY OF ORGANIC MATERIALS - EFFECT OF LOW-TEMPERATURES

被引：28

作者：

SALIH, SM ^{[1
]}

COSSLETT, VE ^{[1
]}

机构：

[1] UNIV CAMBRIDGE CAVENDISH LAB,CAMBRIDGE,ENGLAND

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1975年 / 105卷 / DEC期

关键词：

D O I：

10.1111/j.1365-2818.1975.tb04059.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：269 / 276

页数：8

共 24 条

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[2]

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[4]

GLAESER RM, 1971, J MICROSC-PARIS, V12, P133

[5]

GLAESER RM, 1974, 3RD P INT C HIGH VOL, P370

[6]

GLAESER RM, 1975, PHYSICAL ASPECTS ELE

GRUBB, DT .

GRUBB, DT ;

GROVES, GW .

PHILOSOPHICAL MAGAZINE, 1971, 24 (190) :815-&

[9]

GRUBB DT, 1972, 5TH P EUR C EL MICR, P554

[10]

HARTMAN RS, 1974, 8TH INT C EL MICR CA, V2, P674