EXPERIMENTS IN X-RAY HOLOGRAPHIC MICROSCOPY USING SYNCHROTRON RADIATION

[1] X-RAY HOLOGRAM OBTAINED BY USING SYNCHROTRON RADIATION [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1972, 11 (12) : 1857 - 1857

[2] X-RAY HOLOGRAPHIC MICROSCOPY [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1974, 13 (09) : 1385 - 1392

[3] POSSIBILITY OF UTILIZING HOLOGRAPHIC SCHEMES IN X-RAY MICROSCOPY [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1979, 12 (FEB) : 19 - 24

[4] HOLOGRAPHY OF MICROOBJECTS IN SOFT X-RAYS [J]. OPTICS COMMUNICATIONS, 1980, 34 (03) : 332 - 336

[5] TUNABLE COHERENT X-RAYS [J]. SCIENCE, 1985, 228 (4705) : 1265 - 1272

[6] A STUDY IN DIFFRACTION MICROSCOPY WITH SPECIAL REFERENCE TO X-RAYS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1952, 42 (10) : 756 - 762

[7] Born M, 1980, PRINCIPLES OPTICS

[8] FEDER R, 1980, ANN NY ACAD SCI, V343, P213

[9] HOWELLS M, 1985, P SOC PHOTO-OPT INST, V523, P347, DOI 10.1117/12.946306

[10] HOWELLS M, 1984, AIP C P, V118, P85

[1] X-RAY HOLOGRAM OBTAINED BY USING SYNCHROTRON RADIATION [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1972, 11 (12) : 1857 - 1857

[2] X-RAY HOLOGRAPHIC MICROSCOPY [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1974, 13 (09) : 1385 - 1392

[3] POSSIBILITY OF UTILIZING HOLOGRAPHIC SCHEMES IN X-RAY MICROSCOPY [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1979, 12 (FEB) : 19 - 24

[4] HOLOGRAPHY OF MICROOBJECTS IN SOFT X-RAYS [J]. OPTICS COMMUNICATIONS, 1980, 34 (03) : 332 - 336

[5] TUNABLE COHERENT X-RAYS [J]. SCIENCE, 1985, 228 (4705) : 1265 - 1272

[6] A STUDY IN DIFFRACTION MICROSCOPY WITH SPECIAL REFERENCE TO X-RAYS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1952, 42 (10) : 756 - 762

[7] Born M, 1980, PRINCIPLES OPTICS

[8] FEDER R, 1980, ANN NY ACAD SCI, V343, P213

[9] HOWELLS M, 1985, P SOC PHOTO-OPT INST, V523, P347, DOI 10.1117/12.946306

[10] HOWELLS M, 1984, AIP C P, V118, P85