CRACK-PROPAGATION AND FAILURE PREDICTION IN SILICON-NITRIDE AT ELEVATED-TEMPERATURES

被引：157

作者：

EVANS, AG ^{[1
]}

WIEDERHORN, SM ^{[1
]}

机构：

[1] NBS, WASHINGTON, DC 20234 USA

来源：

关键词：

D O I：

10.1007/BF00550951

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：270 / 278

页数：9

共 16 条

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EVANS, AG
[J]. JOURNAL OF MATERIALS SCIENCE, 1972, 7 (10) : 1137 - &
[2] EVANS AG, 1973, NBSIR73147
[3] EVANS AG, TO BE PUBLISHED
[4] EVANS AG, UNPUBLISHED WORK
[5] FRAZIER W, UNPUBLISHED WORK
[6] KNAUSS WG, 1970, INT J FRACT MECH, V6, P7
[7] KOSSOWSKY R, UNPUBLISHED WORK
[8] LANGE FF, TO BE PUBLISHED
[9] LANGE FF, 1972, 72GT56ASTM PUBL
[10] MCLINTOCK FA, 1965, P ROY SOC LOND A MAT, V285, P58