SEMICONDUCTOR SURFACE DAMAGE PRODUCED BY RUBY LASERS

[1] STUDY OF OPTICAL DIFFRACTION IMAGES AT MICROWAVE FREQUENCIES [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1957, 47 (05) : 428 - 438

[2] MODULATION OF REFLECTIVITY OF SEMICONDUCTORS [J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (02) : 657 - &

[3] BORN M, 1964, PRINCIPLES OPTICS, P435

[4] THE BEHAVIOUR OF GLASSES AND CERAMICS AT HIGH RATES OF HEAT TRANSFER [J]. JOURNAL OF NUCLEAR MATERIALS, 1964, 12 (01) : 1 - 15

[5] HILSUM C, 1961, SEMICONDUCTION 3-V C, P13

[6] MOSS TS, 1961, OPTICAL PROPERTIES S, P9

[1] STUDY OF OPTICAL DIFFRACTION IMAGES AT MICROWAVE FREQUENCIES [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1957, 47 (05) : 428 - 438

[2] MODULATION OF REFLECTIVITY OF SEMICONDUCTORS [J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (02) : 657 - &

[3] BORN M, 1964, PRINCIPLES OPTICS, P435

[4] THE BEHAVIOUR OF GLASSES AND CERAMICS AT HIGH RATES OF HEAT TRANSFER [J]. JOURNAL OF NUCLEAR MATERIALS, 1964, 12 (01) : 1 - 15

[5] HILSUM C, 1961, SEMICONDUCTION 3-V C, P13

[6] MOSS TS, 1961, OPTICAL PROPERTIES S, P9