ETHYLENE ON CLEAVED SILICON - HIGH-RESOLUTION ELECTRON-ENERGY-LOSS STUDY OF AN UNUSUAL ADSORPTION SYSTEM IN THE TEMPERATURE-RANGE 85-300-K

被引：18

作者：

PIANCASTELLI, MN

KELLY, MK

KILDAY, DG

MARGARITONDO, G

FRANKEL, DJ

LAPEYRE, GJ

机构：

[1] UNIV WISCONSIN,DEPT PHYS,MADISON,WI 53706

[2] UNIV WISCONSIN,CTR SYNCHROTRON RADIAT,MADISON,WI 53706

[3] MONTANA STATE UNIV,DEPT PHYS,BOZEMAN,MT 59717

[4] UNIV ROME 2,DEPT CHEM SCI & TECHNOL,I-00173 ROME,ITALY

来源：

PHYSICAL REVIEW B | 1987年 / 35卷 / 03期

关键词：

D O I：

10.1103/PhysRevB.35.1461

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1461 / 1464

页数：4

共 18 条

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[5] SPECULAR AND OFF-SPECULAR HIGH-RESOLUTION ELECTRON-ENERGY LOSS SPECTROSCOPY OF ACETYLENE AND ETHYLENE ON TUNGSTEN(100) [J].

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[6]

Herzberg G., 1945, MOL SPECTRA MOL STRU, V2

[7]

Ibach H., 1982, ELECTRON ENERGY LOSS

[8]

LEHWALD S, 1979, SURF SCI, V89, P425, DOI 10.1016/0039-6028(79)90628-9

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CHEMICAL PHYSICS LETTERS, 1982, 87 (01) :87-91

[10] PYRIDINE CHEMISORPTION ON SILICON AND GERMANIUM(111) SURFACES [J].

PIANCASTELLI, MN ;

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ROWE, JE .

SOLID STATE COMMUNICATIONS, 1983, 45 (03) :219-221

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