ON A GENERALIZED INTERFERENCE EQUATION AND INTERFEROMETRIC MEASUREMENTS

被引:24
作者
DUARTE, FJ
机构
[1] Imaging Research Laboratories, Eastman Kodak Company
关键词
6;
D O I
10.1016/0030-4018(93)90634-H
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A generalized interference equation derived using the Dirac formalism is applied to characterize interference and/or diffraction phenomena in either the near or the far field. Comparison of numerical calculations with measurements illustrates the usefulness of the equation.
引用
收藏
页码:8 / 14
页数:7
相关论文
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