RADIATION-DAMAGE INDUCED DOSE-RATE NON-LINEARITY IN AN N-TYPE SILICON DETECTOR

被引：40

作者：

GRUSELL, E ^{[1
]}

RIKNER, G ^{[1
]}

机构：

[1] AKAD SJUKHUSET UPPSALA, INST ONCOL, DIV HOSP PHYS, S-75185 UPPSALA, SWEDEN

来源：

ACTA RADIOLOGICA ONCOLOGY | 1984年 / 23卷 / 06期

关键词：

D O I：

10.3109/02841868409136050

中图分类号：

R73 [肿瘤学];

学科分类号：

100214 ;

摘要：

引用

页码：465 / 469

页数：5

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