DIRECT OBSERVATION OF SURFACE CHEMICAL ORDER BY SCANNING TUNNELING MICROSCOPY

被引：207

作者：

SCHMID, M

STADLER, H

VARGA, P

机构：

[1] Institut für Allgemeine Physik, Technische Universität Wien

来源：

PHYSICAL REVIEW LETTERS | 1993年 / 70卷 / 10期

关键词：

D O I：

10.1103/PhysRevLett.70.1441

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We present the first scanning tunneling microscopy (STM) study which allows clear discrimination of two chemical species in a metal alloy. Special tunneling conditions, which we attribute to an adsorbate at the STM tip, cause a difference in corrugation between Pt and Ni atoms of 0.3 angstrom. The STM data reveal chemical short-range order at the surface, which is in agreement with embedded atom simulations and can be understood as small domains of an L1(0) ordered phase.

引用

页码：1441 / 1444

页数：4

共 31 条

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