HIGH-PRESSURE X-RAY-DIFFRACTION AT LIQUID-HELIUM TEMPERATURE

被引：14

作者：

ENDO, S ^{[1
]}

MITSUI, T ^{[1
]}

机构：

[1] HOKKAIDO UNIV,FAC SCI,DEPT PHYS,SAPPORO,HOKKAIDO 060,JAPAN

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1976年 / 47卷 / 10期

关键词：

D O I：

10.1063/1.1134506

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：1275 / 1278

页数：4

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