NEW LINE CLASSIFICATIONS IN HO-I BASED ON HIGH-PRECISION HYPERFINE-STRUCTURE MEASUREMENT OF LOW-LEVELS

被引：28

作者：

CHILDS, WJ

COK, DR

GOODMAN, LS

机构：

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1983年 / 73卷 / 02期

关键词：

D O I：

10.1364/JOSA.73.000151

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：151 / 155

页数：5

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