HIGH-RESOLUTION SMALL-ANGLE X-RAY-SCATTERING CAMERA FOR ANOMALOUS SCATTERING

被引：94

作者：

LONG, GG ^{[1
]}

JEMIAN, PR ^{[1
]}

WEERTMAN, JR ^{[1
]}

BLACK, DR ^{[1
]}

BURDETTE, HE ^{[1
]}

SPAL, R ^{[1
]}

机构：

[1] NORTHWESTERN UNIV, INST TECHNOL, EVANSTON, IL 60208 USA

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1991年 / 24卷

关键词：

D O I：

10.1107/S0021889890009256

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The design and operation of a new small-angle X-ray scattering instrument, optimized for high throughput at a synchrotron source, high angular and wave-length resolution, large sample cross-sectional area, accurate energy tunning, excellent signal-to-noise ratio and harmonic rejection are presented. The principles of design and implementation are given, as are the details of primary calibration of absolute intensity and experimental desmearing. The instrument has been tested for application to anomalous-scattering measurements near the chromium K edge. Preliminary results on samples of a heat-treated steel are presented as a demonstration of the capability of this experiment to separate the microstructure evolution as a function of temperature of a chromium-rich precipitate from the thermal behavior of other precipitates in the steel.

引用

页码：30 / 37

页数：8

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