THIN FILM X-RAY STANDARD

被引:3
作者
DAVEY, JE
机构
关键词
D O I
10.1063/1.1718760
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
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页码:1372 / &
相关论文
共 4 条
[1]  
KLUG HP, 1954, XRAY DIFFRACTION PRO
[2]  
SIMMONS RO, 1963, J PHYS SOC JAPAN S2, V18, P172
[3]   X-RAY STUDIES OF DEFORMED METALS [J].
WARREN, BE .
PROGRESS IN METAL PHYSICS, 1959, 8 :147-202
[4]   GEIGER-COUNTER X-RAY SPECTROMETER INFLUENCE OF SIZE AND ABSORPTION COEFFICIENT OF SPECIMEN ON POSITION AND SHAPE OF POWDER DIFFRACTION MAXIMA [J].
WILSON, AJC .
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1950, 27 (12) :321-325