CHEMICAL-POTENTIAL MAPS AND SPATIAL CORRELATIONS IN 2D-ISLAND RIPENING ON SI(001)

被引:110
作者
THEIS, W [1 ]
BARTELT, NC [1 ]
TROMP, RM [1 ]
机构
[1] UNIV MARYLAND,DEPT PHYS,COLLEGE PK,MD 20742
关键词
D O I
10.1103/PhysRevLett.75.3328
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We have used low energy electron microscopy to study the roles of surface diffusion and step-edge attachment kinetics in 2D-island ripening, a phenomenon closely related to epitaxial growth. From experimental maps of the chemical potential, showing variations of up to a factor of 3, we conclude that nearest-neighbor correlations between islands are of central importance, in contrast to common mean-field theory. Detailed simulations of the time evolution of specific island configurations are in close agreement with experimental results.
引用
收藏
页码:3328 / 3331
页数:4
相关论文
共 14 条
[1]   STEP CAPILLARY WAVES AND EQUILIBRIUM ISLAND SHAPES ON SI(001) [J].
BARTELT, NC ;
TROMP, RM ;
WILLIAMS, ED .
PHYSICAL REVIEW LETTERS, 1994, 73 (12) :1656-1659
[2]  
BARTELT NC, IN PRESS
[3]   CLUSTERING ACROSS CONCENTRATION GRADIENTS [J].
CARLOW, GR ;
ZINKEALLMANG, M .
CANADIAN JOURNAL OF PHYSICS, 1994, 72 (11-12) :812-817
[4]   MONTE-CARLO GENERATION OF RANDOM POLYGONS [J].
CRAIN, IK .
COMPUTERS & GEOSCIENCES, 1978, 4 (02) :131-141
[5]   SURFACE SELF-DIFFUSION ON SI FROM THE EVOLUTION OF PERIODIC ATOMIC STEP ARRAYS [J].
KEEFFE, ME ;
UMBACH, CC ;
BLAKELY, JM .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1994, 55 (10) :965-973
[6]   CORRELATED OSTWALD RIPENING IN 2 DIMENSIONS [J].
KRICHEVSKY, O ;
STAVANS, J .
PHYSICAL REVIEW LETTERS, 1993, 70 (10) :1473-1476
[7]   ORDERING KINETICS AT SURFACES [J].
LAGALLY, MG ;
KARIOTIS, R ;
SWARTZENTRUBER, BS ;
MO, YW .
ULTRAMICROSCOPY, 1989, 31 (01) :87-98
[8]   THE KINETICS OF PRECIPITATION FROM SUPERSATURATED SOLID SOLUTIONS [J].
LIFSHITZ, IM ;
SLYOZOV, VV .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1961, 19 (1-2) :35-50
[9]   CORRELATIONS AND OSTWALD RIPENING [J].
MARDER, M .
PHYSICAL REVIEW A, 1987, 36 (02) :858-874
[10]   AN ANALYTICAL REFLECTION AND EMISSION UHV SURFACE ELECTRON-MICROSCOPE [J].
TELIEPS, W ;
BAUER, E .
ULTRAMICROSCOPY, 1985, 17 (01) :57-65