SYNCHROTRON X-RAY RIETVELD ANALYSIS OF ALPHA-HAFNIUM PHOSPHATE

被引:18
作者
NAKAI, I
IMAI, K
KAWASHIMA, T
OHSUMI, K
IZUMI, F
TOMITA, I
机构
[1] NATL LAB HIGH ENERGY PHYS,PHONTON FACTORY,TSUKUBA,IBARAKI 305,JAPAN
[2] NATL INST RES INORGAN MAT,SAKURA,IBARAKI 305,JAPAN
[3] OCHANOMIZU UNIV,FAC SCI,DEPT CHEM,TOKYO 112,JAPAN
关键词
inorganic ion exchanger; synchrotron radiation; X-ray powder diffraction; X-ray Rietveld analysis; α-hafnium bis(monohydrogen orthophosphate)monohydrate;
D O I
10.2116/analsci.6.689
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The crystal structure of a-hafnium bis(monohydrogen orthophosphate)monohydrate, an inorganic ion-exchanger, was solved by the X-ray Rietveld technique utilizing synchrotron radiation (SR) as the X-ray source. This compound is monoclinic with space group P21/n and cell parameters a=9.0142(1), b=5.25665(5), c=15.4768(2) Å and β=101.636(1)°. Intensity data were collected by a capillary method with monochromatic X-rays of wavelength λ=1.49977(1) Å. The results were compared with those obtained by a conventional X-ray source and the advantages of SR in Rietveld analysis were verified. Despite the difference in the Li-ion exchange behavior between the α-hafnium phosphate and the α-zirconium phosphate, both phases were found to be isostructural with each other. © 1990, The Japan Society for Analytical Chemistry. All rights reserved.
引用
收藏
页码:689 / 693
页数:5
相关论文
共 16 条
[1]   ON MECHANISM OF ION EXCHANGE IN CRYSTALLINE ZIRCONIUM PHOSPHATES .I. SODIUM ION EXCHANGE OF ALPHA-ZIRCONIUM PHOSPHATE [J].
CLEARFIE.A ;
DUAX, WL ;
MEDINA, AS ;
SMITH, GD ;
THOMAS, JR .
JOURNAL OF PHYSICAL CHEMISTRY, 1969, 73 (10) :3424-&
[2]   CRYSTALLOGRAPHY AND STRUCTURE OF ALPHA-ZIRCONIUM BIS(MONOHYDROGEN ORTHOPHOSPHATE) MONOHYDRATE [J].
CLEARFIELD, A ;
SMITH, GD .
INORGANIC CHEMISTRY, 1969, 8 (03) :431-+
[3]   SYNCHROTRON X-RAY-POWDER DIFFRACTION [J].
HASTINGS, JB ;
THOMLINSON, W ;
COX, DE .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1984, 17 (APR) :85-95
[4]  
IZUMI F, 1985, J CRYSTALLOGR SOC JA, V27, P23
[5]   STRUCTURE OF THE HIGH-TC SUPERCONDUCTOR, BA2LACU3-XO7-Y - STUDIES ON LA-BA ORDERING AND OXYGEN DEFECTS [J].
NAKAI, I ;
IMAI, K ;
KAWASHIMA, T ;
YOSHIZAKI, R .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1987, 26 (07) :L1244-L1247
[6]  
NAKAI I, 1989, 6 PHOT FACT ACT REP, P153
[7]   NEW POWDER DIFFRACTOMETER FOR THE PHOTON FACTORY [J].
OZAWA, H ;
UNO, R ;
YAMANAKA, T ;
MORIKAWA, H ;
ANDO, M ;
OHSUMI, K ;
NUKUI, A ;
YUKINO, K ;
KAWASAKI, T .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (07) :2382-2385
[8]   LINE PROFILES OF NEUTRON POWDER-DIFFRACTION PEAKS FOR STRUCTURE REFINEMENT [J].
RIETVELD, HM .
ACTA CRYSTALLOGRAPHICA, 1967, 22 :151-&
[9]   A PROFILE REFINEMENT METHOD FOR NUCLEAR AND MAGNETIC STRUCTURES [J].
RIETVELD, HM .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1969, 2 :65-&
[10]  
SASAKI S, 1984, 1983 1984 PHOT FACT, P10