X-RAY DIFFRACTOMETER ATTACHMENT FOR DIRECT OBSERVATION OF EVAPORATED THIN FILMS

被引：8

作者：

VOOK, RW

SCHOENING, FRL

机构：

来源：

关键词：

D O I：

10.1063/1.1718576

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：792 / &

共 6 条

[1] AN X-RAY STUDY IN HIGH VACUUM OF THE STRUCTURE OF EVAPORATED COPPER FILMS
KEITH, HD
[J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1956, 69 (02): : 180 - &
[2] PARRISH W, 1959, INTERNATIONAL TABLES, V2, P216
[3] RONTGENOGRAPHISCHE UNTERSUCHUNGEN AN KONDENSIERTEN ZINNFILMEN BEI TIEFEN TEMPERATUREN
RUHL, W
[J]. ZEITSCHRIFT FUR PHYSIK, 1954, 138 (02): : 121 - 135
[4] SIEGEL BM, 1959, STRUCTURE PROPERTIES, P97
[5] VOOK RW, 1963, B AM PHYS SOC, V8, P228
[6] X-RAY STUDIES OF DEFORMED METALS
WARREN, BE
[J]. PROGRESS IN METAL PHYSICS, 1959, 8 : 147 - 202