GATE PROPAGATION DELAY AND LOGIC TIMING OF GAAS INTEGRATED-CIRCUITS MEASURED BY ELECTROOPTIC SAMPLING

被引：7

作者：

RODWELL, MJW

WEINGARTEN, KJ

FREEMAN, JL

BLOOM, DM

机构：

来源：

ELECTRONICS LETTERS | 1986年 / 22卷 / 09期

关键词：

D O I：

10.1049/el:19860339

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：499 / 501

页数：3

相关论文

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[8] DIRECT ELECTRO-OPTIC SAMPLING OF GAAS INTEGRATED-CIRCUITS
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