GATE PROPAGATION DELAY AND LOGIC TIMING OF GAAS INTEGRATED-CIRCUITS MEASURED BY ELECTROOPTIC SAMPLING

被引:7
作者
RODWELL, MJW
WEINGARTEN, KJ
FREEMAN, JL
BLOOM, DM
机构
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D O I
10.1049/el:19860339
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:499 / 501
页数:3
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