APPLICATIONS OF MOIRE TOPOGRAPHY MEASUREMENT METHODS IN INDUSTRY

被引：11

作者：

SUZUKI, M

KANAYA, M

机构：

来源：

关键词：

D O I：

10.1016/0143-8166(88)90037-1

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：171 / 188

页数：18

共 12 条

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[2] GENERATION OF SURFACE CONTOURS BY MOIRE PATTERNS [J].

MEADOWS, DM ;

JOHNSON, WO ;

ALLEN, JB .

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[3]

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[4]

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[5]

SUZUKI M, 1975, IMAGE TECHNOLOGY, V6, P61

[6]

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[7]

SUZUKI M, 1974, PREC INSTRUM, V40, P36

[8]

SUZUKI M, 1971 P SPRING GEN M

[9]

Takasaki H., 1970, APPL OPTICS, V9, P1457

[10]

TSUJIUCHI J, 2ND P MOIR RES SOC