X-RAY-DIFFRACTION STUDIES OF MISCUT CRYSTAL-SURFACES AND OVERLAYERS - A DYNAMICAL DIFFRACTION APPROACH

被引:1
作者
KAU, CP [1 ]
GAU, TS [1 ]
CHANG, SL [1 ]
机构
[1] SYNCHROTRON RADIAT RES CTR,HSINCHU 30077,TAIWAN
关键词
X-RAY DIFFRACTION; CRYSTALS; SURFACES;
D O I
10.1016/0254-0584(95)80017-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
X-ray surface diffraction data from a miscut Fe3Al crystal and the non-specular crystal-truncation rod of a monolayer Au on a Ge(111) surface are interpreted using the dynamical theory in relation to the structures of surface/interface of thin films and bulk crystals. It is found that in the miscut crystal the X-ray penetration depth depends on the crystal miscut angle due to the boundary effect on the excitation of mode of wave propagation. For the Au/Ge(111) case, the diffracted intensity must be summed up in a kinematical fashion to take account of the scattering from the deposited overlayers. This dynamical calculation scheme provides an absolute scale for intensity versus momentum transfer which is useful for surface-and thin film analysis.
引用
收藏
页码:128 / 133
页数:6
相关论文
共 17 条
[1]   X-RAY-DIFFRACTION UNDER SPECULAR REFLECTION CONDITIONS - IDEAL CRYSTALS [J].
AFANASEV, AM ;
MELKONYAN, MK .
ACTA CRYSTALLOGRAPHICA SECTION A, 1983, 39 (MAR) :207-210
[2]   BRAGG-LAUE DIFFRACTION IN INCLINED GEOMETRY [J].
ALEKSANDROV, PA ;
AFANASIEV, AM ;
STEPANOV, SA .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1984, 86 (01) :143-154
[3]   DEPTH-CONTROLLED GRAZING-INCIDENCE DIFFRACTION OF SYNCHROTRON X-RADIATION [J].
DOSCH, H ;
BATTERMAN, BW ;
WACK, DC .
PHYSICAL REVIEW LETTERS, 1986, 56 (11) :1144-1147
[4]   EVANESCENT ABSORPTION IN KINEMATIC SURFACE BRAGG-DIFFRACTION [J].
DOSCH, H .
PHYSICAL REVIEW B, 1987, 35 (05) :2137-2143
[5]   SURFACE-STRUCTURE DETERMINATION BY X-RAY-DIFFRACTION [J].
FEIDENHANSL, R .
SURFACE SCIENCE REPORTS, 1989, 10 (03) :105-188
[6]  
GAU TS, 1994, PHYS LETT A, V196, P223, DOI 10.1016/0375-9601(94)91230-0
[7]  
GREY F, 1989, J PHYS-PARIS, P181
[8]   STRUCTURE OF GE(111)ROOT-3X-ROOT-3R30-DEGREES-AU DETERMINED BY SURFACE X-RAY-DIFFRACTION [J].
HOWES, PB ;
NORRIS, C ;
FINNEY, MS ;
VLIEG, E ;
VANSILFHOUT, RG .
PHYSICAL REVIEW B, 1993, 48 (03) :1632-1642
[9]   HIGH-RESOLUTION INVESTIGATION OF THE ROD-SHAPED SCATTERING FROM A (111) SI SURFACE BY A SYNCHROTRON RADIATION SOURCE [J].
KASHIWAGURA, N ;
KASHIHARA, Y ;
SAKATA, M ;
HARADA, J ;
WILKINS, SW ;
STEVENSON, AW .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1987, 26 (12) :L2026-L2029
[10]   ROUGHENING TRANSITION OF A STEPPED CU(113) SURFACE - A SYNCHROTRON X-RAY-SCATTERING STUDY [J].
LIANG, KS ;
SIROTA, EB ;
DAMICO, KL ;
HUGHES, GJ ;
SINHA, SK .
PHYSICAL REVIEW LETTERS, 1987, 59 (21) :2447-2450