COLLIMATION TEST BY DOUBLE GRATING SHEARING INTERFEROMETER

被引：58

作者：

PATORSKI, K ^{[1
]}

YOKOZEKI, S ^{[1
]}

SUZUKI, T ^{[1
]}

机构：

[1] OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,SUITA,OSAKA 565,JAPAN

来源：

APPLIED OPTICS | 1976年 / 15卷 / 05期

关键词：

D O I：

10.1364/AO.15.001234

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1234 / 1240

页数：7

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