DEGRADATION OF THIN TELLURIUM-FILMS

被引:33
作者
LEE, WY
GEISS, RH
机构
关键词
D O I
10.1063/1.332156
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1351 / 1357
页数:7
相关论文
共 19 条
[11]   BIT ORIENTED OPTICAL STORAGE WITH THIN TELLURIUM-FILMS [J].
LOU, DY ;
BLOM, GM ;
KENNEY, GC .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (01) :78-86
[12]  
MERDY H, 1966, ANN PHYS-PARIS, V1, P289
[13]   THE STABILITY OF TELLURIUM-FILMS IN MOIST AIR - A MODEL FOR ATMOSPHERIC CORROSION [J].
MILCH, A ;
TASAICO, P .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1980, 127 (04) :884-891
[14]   STUDIES OF CLEAN AND OXIDIZED TELLURIUM SURFACES [J].
MUSKET, RG .
SURFACE SCIENCE, 1978, 74 (02) :423-436
[15]   GRAIN-GROWTH OF EVAPORATED TE FILMS ON A HEATED AND COOLED SUBSTRATE [J].
OKUYAMA, K ;
KUMAGAI, Y .
JOURNAL OF APPLIED PHYSICS, 1975, 46 (04) :1473-1477
[16]   X-RAY-EMISSION MEASUREMENTS OF OXYGEN ON (0001) AND (1010) SURFACES OF TELLURIUM [J].
SEWELL, PB ;
MITCHELL, DF .
SURFACE SCIENCE, 1976, 55 (01) :367-372
[17]   ELECTRON MEAN FREE-PATH IN CDTE - 350-1450EV [J].
SZAJMAN, J ;
LECKEY, RCG ;
LIESEGANG, J ;
JENKIN, JG .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1980, 20 (04) :323-326
[18]   CHALCOGENIDE THIN-FILMS FOR LASER-BEAM RECORDINGS BY THERMAL CREATION OF HOLES [J].
TERAO, M ;
SHIGEMATSU, K ;
OJIMA, M ;
TANIGUCHI, Y ;
HORIGOME, S ;
YONEZAWA, S .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (11) :6881-6886
[19]  
1969, CRC HDB CHEM PHYSICS