WET STAGE MODIFICATION TO A SCANNING ELECTRON-MICROSCOPE

被引:34
作者
ROBINSON, VNE [1 ]
机构
[1] UNIV NEW S WALES, FAC APPL SCI, POB 1, KENSINGTON 2033, NEW S WALES, AUSTRALIA
关键词
D O I
10.1111/j.1365-2818.1975.tb04538.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:71 / 77
页数:7
相关论文
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