PROXIMITY EFFECT IN EDGE TYPE JUNCTIONS WITH PRBA2CU3O7 BARRIERS PREPARED BY BR-ETHANOL ETCHING

被引:11
作者
FALEY, MI [1 ]
POPPE, U [1 ]
JIA, CL [1 ]
URBAN, K [1 ]
XU, Y [1 ]
机构
[1] INST SCHICHT & IONENTECH, D-52425 JULICH, GERMANY
关键词
D O I
10.1109/77.402995
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Multilayer Josephson edge type junctions were prepared on the edges of c-axis oriented YBa2Cu3O7 thin films structured by chemical etching in a Br-ethanol solution. Resistive PrBa2Cu3-xGaxO7 (x=0, 0.15, and 0.3) films were deposited by the high oxygen pressure de-sputtering technique and used for barrier and insulation layers. Basic properties of the junctions Such as I-c(T), I-c(d), R(n)(T), and basic: characteristics of the proximity effect such as xi(n), gamma and gamma(B) were obtained and discussed.
引用
收藏
页码:2091 / 2094
页数:4
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