RAMAN-SCATTERING FROM EXTREMELY THIN HARD AMORPHOUS-CARBON FILMS

被引：50

作者：

RAMSTEINER, M

WAGNER, J

WILD, C

KOIDL, P

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1987年 / 62卷 / 02期

关键词：

D O I：

10.1063/1.339754

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：729 / 731

页数：3

共 14 条

[1]

Angus J.C., 1986, PLASMA DEPOSITED THI, P89

[2] DIELECTRIC FUNCTIONS AND OPTICAL-PARAMETERS OF SI, GE, GAP, GAAS, GASB, INP, INAS, AND INSB FROM 1.5 TO 6.0 EV [J].

ASPNES, DE ;

STUDNA, AA .

PHYSICAL REVIEW B, 1983, 27 (02) :985-1009

[3] VIBRATIONAL PROPERTIES OF AL2O3 FILMS ON GOLD, ALUMINUM, AND SILICON [J].

BRUESCH, P ;

KOTZ, R ;

NEFF, H ;

PIETRONERO, L .

PHYSICAL REVIEW B, 1984, 29 (08) :4691-4696

[4] INFRARED-ABSORPTION OF HYDROGENATED AMORPHOUS SI-C AND GE-C FILMS [J].

CATHERINE, Y ;

TURBAN, G .

THIN SOLID FILMS, 1980, 70 (01) :101-104

[5] INTERFERENCE ENHANCED RAMAN-SCATTERING FROM VERY THIN ABSORBING FILMS [J].

CONNELL, GAN ;

NEMANICH, RJ ;

TSAI, CC .

APPLIED PHYSICS LETTERS, 1980, 36 (01) :31-33

[6] USE OF RAMAN-SCATTERING TO INVESTIGATE DISORDER AND CRYSTALLITE FORMATION IN AS-DEPOSITED AND ANNEALED CARBON-FILMS [J].

DILLON, RO ;

WOOLLAM, JA ;

KATKANANT, V .

PHYSICAL REVIEW B, 1984, 29 (06) :3482-3489

[7]

DISCHLER B, 1985, 7TH P INT S PLASM CH, P45

[8] INTERFERENCE-ENHANCED RAMAN-SCATTERING OF VERY THIN TITANIUM AND TITANIUM-OXIDE FILMS [J].

NEMANICH, RJ ;

TSAI, CC ;

CONNELL, GAN .

PHYSICAL REVIEW LETTERS, 1980, 44 (04) :273-276

[9]

Richter W., 1976, SPRINGER TRACTS MODE, V78, P121

[10] CARBON-FILMS - STRUCTURE AND MICROTEXTURE (OPTICAL AND ELECTRON-MICROSCOPY, RAMAN-SPECTROSCOPY) [J].

ROUZAUD, JN ;

OBERLIN, A ;

BENYBASSEZ, C .

THIN SOLID FILMS, 1983, 105 (01) :75-96

← 1 2 →