DERIVATIVE MEASUREMENT BY FREQUENCY MIXING

[1] COLEMAN RV, 1974, METHODS EXPT PHYSICS, V2, P193

[2] DIXON RM, UNPUBLISHED

[3] Eliseev P. G., 1971, Physics of p-n junctions and semiconductor devices (2nd edition), P150

[4] MEASUREMENT SYSTEM FOR DERIVATIVE STUDIES [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (01) : 90 - &

[5] NOISE LOADING ANALYSIS OF A THIRD-ORDER NONLINEAR SYSTEM WITH MEMORY [J]. IEEE TRANSACTIONS ON COMMUNICATION TECHNOLOGY, 1968, CO16 (05): : 701 - +

[6] SATURATION OF JUNCTION VOLTAGE IN STRIPE-GEOMETRY (AIGA)AS DOUBLE-HETEROSTRUCTURE JUNCTION LASERS [J]. APPLIED PHYSICS LETTERS, 1976, 28 (12) : 714 - 716

[7] PAOLI TL, UNPUBLISHED

[8] Sze S.M., 1969, PHYS SEMICONDUCTOR D, P96

[9] AN ANALYSIS OF THE INTERMODULATION METHOD OF DISTORTION MEASUREMENT [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1948, 36 (04): : 457 - 466

[1] COLEMAN RV, 1974, METHODS EXPT PHYSICS, V2, P193

[2] DIXON RM, UNPUBLISHED

[3] Eliseev P. G., 1971, Physics of p-n junctions and semiconductor devices (2nd edition), P150

[4] MEASUREMENT SYSTEM FOR DERIVATIVE STUDIES [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (01) : 90 - &

[5] NOISE LOADING ANALYSIS OF A THIRD-ORDER NONLINEAR SYSTEM WITH MEMORY [J]. IEEE TRANSACTIONS ON COMMUNICATION TECHNOLOGY, 1968, CO16 (05): : 701 - +

[6] SATURATION OF JUNCTION VOLTAGE IN STRIPE-GEOMETRY (AIGA)AS DOUBLE-HETEROSTRUCTURE JUNCTION LASERS [J]. APPLIED PHYSICS LETTERS, 1976, 28 (12) : 714 - 716

[7] PAOLI TL, UNPUBLISHED

[8] Sze S.M., 1969, PHYS SEMICONDUCTOR D, P96

[9] AN ANALYSIS OF THE INTERMODULATION METHOD OF DISTORTION MEASUREMENT [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1948, 36 (04): : 457 - 466