HIGH-RESOLUTION X-RAY SPECTROSCOPY USING SYNCHROTRON RADIATION - SOURCE CHARACTERISTICS AND OPTICAL SYSTEMS

被引：22

作者：

PIANETTA, P

LINDAU, I

机构：

[1] STANFORD UNIV,STANFORD ELECTR LABS,STANFORD,CA 94305

[2] STANFORD UNIV,STANFORD SYNCHROTRON RADIAT PROJECT,STANFORD,CA 94305

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1977年 / 11卷 / 01期

关键词：

D O I：

10.1016/0368-2048(77)85046-9

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：13 / 38

页数：26

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