SCANNING FORCE MICROSCOPY OF HEAVY-ION TRACKS

被引：12

作者：

ACKERMANN, J ^{[1
]}

GRAFSTROM, S ^{[1
]}

NEITZERT, M ^{[1
]}

NEUMANN, R ^{[1
]}

TRAUTMANN, C ^{[1
]}

VETTER, J ^{[1
]}

ANGERT, N ^{[1
]}

机构：

[1] UNIV HEIDELBERG,INST PHYS,W-6900 HEIDELBERG,GERMANY

来源：

RADIATION EFFECTS AND DEFECTS IN SOLIDS | 1993年 / 126卷 / 1-4期

关键词：

D O I：

10.1080/10420159308219711

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

Polycarbonate, polyimide, and glass samples were irradiated with heavy ions in the 11.4-14.0 MeV/amu energy range at the UNILAC of GSI. After etching and partly coating the specimens with a thin gold layer, ion tracks were studied with scanning force microscopy, including imaging in the lateral-force mode. Results on pore features such as the radius as a function of etching time are presented.

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页码：213 / 216

页数：4

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