TESTS OF QED IN 2-ELECTRON IONS .1. METHODOLOGY AND 23P FINE-STRUCTURE

被引：28

作者：

HATA, J

GRANT, IP

机构：

来源：

关键词：

D O I：

10.1088/0022-3700/16/4/006

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：507 / 521

页数：15

共 45 条

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