学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
PILE UP OF IMPLANTED PHOSPHORUS DURING PALLADIUM SILICIDE FORMATION AND THE CHARACTERISTICS OF SCHOTTKY-BARRIER DIODES
被引:15
作者
:
KIKUCHI, A
论文数:
0
引用数:
0
h-index:
0
KIKUCHI, A
机构
:
来源
:
JOURNAL OF APPLIED PHYSICS
|
1983年
/ 54卷
/ 07期
关键词
:
D O I
:
10.1063/1.332579
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:3998 / 4000
页数:3
相关论文
共 6 条
[1]
INADACHI M, 1979, ISSCC, P108
[2]
REDISTRIBUTION OF IMPLANTED PHOSPHORUS AFTER PLATINUM SILICIDE FORMATION AND THE CHARACTERISTICS OF SCHOTTKY-BARRIER DIODES
[J].
KIKUCHI, A
论文数:
0
引用数:
0
h-index:
0
KIKUCHI, A
;
SUGAKI, S
论文数:
0
引用数:
0
h-index:
0
SUGAKI, S
.
JOURNAL OF APPLIED PHYSICS,
1982,
53
(05)
:3690
-3693
[3]
ELECTRON-TRANSPORT ACROSS ALUMINUM ULTRATHIN SILICON-OXIDE PHOSPHORUS IMPLANTED SILICON BARRIERS
[J].
KIKUCHI, A
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
KIKUCHI, A
;
YAMAMOTO, H
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
YAMAMOTO, H
;
IWATA, S
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
IWATA, S
;
IKEDA, T
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
IKEDA, T
;
NAKATA, K
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
NAKATA, K
.
JOURNAL OF APPLIED PHYSICS,
1980,
51
(09)
:4913
-4918
[4]
DETAILED ANALYSIS OF THIN PHOSPHORUS-DIFFUSED LAYERS IN PARA-TYPE SILICON
[J].
TANNENBAUM, E
论文数:
0
引用数:
0
h-index:
0
TANNENBAUM, E
.
SOLID-STATE ELECTRONICS,
1961,
2
(2-3)
:123
-132
[5]
REDISTRIBUTION OF AS DURING PD2SI FORMATION - ION CHANNELING MEASUREMENTS
[J].
WITTMER, M
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
WITTMER, M
;
TING, CY
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
TING, CY
;
OHDOMARI, I
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
OHDOMARI, I
;
TU, KN
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
TU, KN
.
JOURNAL OF APPLIED PHYSICS,
1982,
53
(10)
:6781
-6787
[6]
REDISTRIBUTION OF IMPLANTED DOPANTS AFTER METAL-SILICIDE FORMATION
[J].
WITTMER, M
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
WITTMER, M
;
SEIDEL, TE
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
SEIDEL, TE
.
JOURNAL OF APPLIED PHYSICS,
1978,
49
(12)
:5827
-5834
←
1
→
共 6 条
[1]
INADACHI M, 1979, ISSCC, P108
[2]
REDISTRIBUTION OF IMPLANTED PHOSPHORUS AFTER PLATINUM SILICIDE FORMATION AND THE CHARACTERISTICS OF SCHOTTKY-BARRIER DIODES
[J].
KIKUCHI, A
论文数:
0
引用数:
0
h-index:
0
KIKUCHI, A
;
SUGAKI, S
论文数:
0
引用数:
0
h-index:
0
SUGAKI, S
.
JOURNAL OF APPLIED PHYSICS,
1982,
53
(05)
:3690
-3693
[3]
ELECTRON-TRANSPORT ACROSS ALUMINUM ULTRATHIN SILICON-OXIDE PHOSPHORUS IMPLANTED SILICON BARRIERS
[J].
KIKUCHI, A
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
KIKUCHI, A
;
YAMAMOTO, H
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
YAMAMOTO, H
;
IWATA, S
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
IWATA, S
;
IKEDA, T
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
IKEDA, T
;
NAKATA, K
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
HITACHI LTD,CTR DEVICE DEV,KODAIRA,TOKYO 187,JAPAN
NAKATA, K
.
JOURNAL OF APPLIED PHYSICS,
1980,
51
(09)
:4913
-4918
[4]
DETAILED ANALYSIS OF THIN PHOSPHORUS-DIFFUSED LAYERS IN PARA-TYPE SILICON
[J].
TANNENBAUM, E
论文数:
0
引用数:
0
h-index:
0
TANNENBAUM, E
.
SOLID-STATE ELECTRONICS,
1961,
2
(2-3)
:123
-132
[5]
REDISTRIBUTION OF AS DURING PD2SI FORMATION - ION CHANNELING MEASUREMENTS
[J].
WITTMER, M
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
WITTMER, M
;
TING, CY
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
TING, CY
;
OHDOMARI, I
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
OHDOMARI, I
;
TU, KN
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
TU, KN
.
JOURNAL OF APPLIED PHYSICS,
1982,
53
(10)
:6781
-6787
[6]
REDISTRIBUTION OF IMPLANTED DOPANTS AFTER METAL-SILICIDE FORMATION
[J].
WITTMER, M
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
WITTMER, M
;
SEIDEL, TE
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
SEIDEL, TE
.
JOURNAL OF APPLIED PHYSICS,
1978,
49
(12)
:5827
-5834
←
1
→