ON PHOTOGRAPHY OF FIELD-ION MICROSCOPE IMAGES

[1] FIELD ION MICROSCOPY WITH EXTERNAL IMAGE INTENSIFIER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1964, 35 (10) : 1297 - &

[2] MEES CEK, 1966, THEORY PHOTOGRAPHIC

[3] MEES CEK, 1954, THEORY PHOTOGRAPHIC

[4] GAS-SURFACE INTERACTIONS AND FIELD-ION MICROSCOPY OF NONREFRACTORY METALS [J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (08) : 2496 - +

[5] CURRENT-VOLTAGE CHARACTERISTICS BY IMAGE PHOTOMETRY IN A FIELD-ION MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (08) : 3065 - &

[6] OPERATION OF FIELD ION MICROSCOPE WITH A DYNAMIC GAS SUPPLY [J]. JOURNAL OF APPLIED PHYSICS, 1961, 32 (08) : 1472 - &

[1] FIELD ION MICROSCOPY WITH EXTERNAL IMAGE INTENSIFIER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1964, 35 (10) : 1297 - &

[2] MEES CEK, 1966, THEORY PHOTOGRAPHIC

[3] MEES CEK, 1954, THEORY PHOTOGRAPHIC

[4] GAS-SURFACE INTERACTIONS AND FIELD-ION MICROSCOPY OF NONREFRACTORY METALS [J]. JOURNAL OF APPLIED PHYSICS, 1965, 36 (08) : 2496 - +

[5] CURRENT-VOLTAGE CHARACTERISTICS BY IMAGE PHOTOMETRY IN A FIELD-ION MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (08) : 3065 - &

[6] OPERATION OF FIELD ION MICROSCOPE WITH A DYNAMIC GAS SUPPLY [J]. JOURNAL OF APPLIED PHYSICS, 1961, 32 (08) : 1472 - &