ADSORPTION STUDY OF SELENIUM ON FE(001) SURFACES BY MEANS OF LEED, AES AND WORK-FUNCTION MEASUREMENTS

被引：10

作者：

NAKANISHI, S

HORIGUCHI, T

机构：

来源：

SURFACE SCIENCE | 1983年 / 133卷 / 2-3期

关键词：

D O I：

10.1016/0039-6028(83)90022-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：605 / 617

页数：13

共 16 条

[1]

BRUCKER CF, 1976, SURFACE SCI, V57, P525

[2] A SIMPLE MODEL FOR DEPENDENCE OF AUGER INTENSITIES ON SPECIMEN THICKNESS [J].

GALLON, TE .

SURFACE SCIENCE, 1969, 17 (02) :486-&

[3] THERMALLY ORDERED OXYGEN ON A NICKEL SURFACE [J].

GERMER, LH ;

MAY, JW ;

SZOSTAK, RJ .

SURFACE SCIENCE, 1967, 7 (03) :430-&

[4]

Heinz T., 1995, LOW ENERGY ELECTRON, V14, P1421

[5]

HORIGUCHI T, 1975, 10TH INT C CRYST AMS, P288

[6]

HORIGUCHI T, 1974, JPN J APPL PHYS S, V2, P89

[7] LOW-ENERGY ELECTRON DIFFRACTION FROM IMPERFECT STRUCTURES [J].

HOUSTON, JE ;

PARK, RL .

SURFACE SCIENCE, 1970, 21 (02) :209-&

[8] MODEL FOR AUGER-ELECTRON SPECTROSCOPY OF SYSTEMS EXHIBITING LAYER GROWTH, AND ITS APPLICATION TO DEPOSITION OF SILVER ON NICKEL [J].

JACKSON, DC ;

GALLON, TE ;

CHAMBERS, A .

SURFACE SCIENCE, 1973, 36 (02) :381-394

[9] HIGH SPATIAL-RESOLUTION SURFACE-POTENTIAL MEASUREMENTS USING SECONDARY ELECTRONS [J].

JANSSEN, AP ;

AKHTER, P ;

HARLAND, CJ ;

VENABLES, JA .

SURFACE SCIENCE, 1980, 93 (2-3) :453-470

[10] DETERMINATION OF C(2X2) STRUCTURE OF SULFUR ON FE[001] BY LOW-ENERGY ELECTRON-DIFFRACTION [J].

LEGG, KO ;

JONA, F ;

JEPSEN, DW ;

MARCUS, PM .

SURFACE SCIENCE, 1977, 66 (01) :25-37

← 1 2 →