MEASUREMENT OF CHARACTERISTIC WAVELENGTHS IN MODULATED MICROSTRUCTURES BY FIELD-ION MICROSCOPY

被引：7

作者：

MILLER, MK ^{[1
]}

BURKE, MG ^{[1
]}

BRENNER, SS ^{[1
]}

机构：

[1] UNIV PITTSBURGH,DEPT MET & MAT ENGN,PITTSBURGH,PA 15261

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1985年 / 139卷 / JUL期

关键词：

D O I：

10.1111/j.1365-2818.1985.tb04659.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：41 / 47

页数：7

共 7 条

[1] ATOMIC SCALE ANALYSIS WITH THE ATOM PROBE [J].

BRENNER, SS ;

MILLER, MK .

JOURNAL OF METALS, 1983, 35 (03) :54-63

[2]

Butler E. P., 1971, Metal Science Journal, V5, P8

BUTLER, EP ;

THOMAS, G .

ACTA METALLURGICA, 1970, 18 (03) :347-&

Daniel, V ;

Lipson, H .

MILLER, MK ;

BURKE, MG ;

BRENNER, SS ;

SOFFA, WA ;

ALEXANDER, KB ;

LAUGHLIN, DE .

SCRIPTA METALLURGICA, 1984, 18 (03) :285-290

[6]

MILLER MK, 1984, SCRIPTA METALL MATER, V18, P111, DOI 10.1016/0036-9748(84)90100-5

[7] STRUCTURE OF ATOMICALLY SMOOTH SPHERICAL SURFACES [J].

MOORE, AJW .